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Project Title:
Parametric Fault Isolation Tester Development

Objective:
Design an affordable and easy to use parametric fault isolation tester that has the ability to do voltage application, curve tracing, latch up testing, short on power analysis, and report generation. It will also be able to effortlessly interface with other tools used during the testing process and will have the capability of testing new products with a simple upgrade to a new family PCB.

Team Members:
Gary Davis, Phuong Ho, Padmashree Patil, Benjamin Schwarz, Nicholas Klein

Issue tracking

open closed Total
Bug 0 0 0
Feature 0 1 1
Task 7 6 13

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0.00 hour

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Watcher: daasch, faustm